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Leak Testing
Air Leak Testing
Pressure Decay Test
Differential Pressure Decay
Multiple Channel Testing
SF6
Gas Leak Detector
Eddy Current Flaw & Crack Test
Criterion CR-11
Criterion ST-11
Zetec Insite
X-Ray
Coating Thickness Measurement
Handheld XRF
Survey Meter
Calibration Standard
XRF / Gold Check
Electronic and Semiconductor Inspection
Security Inspection
Industrial X-ray Machine
X-ray Baggage Scanner
TRINC Dust Control & Static Control
Dust Control (No Wind)
FM-200 LEAK KIT
FM-200
HFC 125
NOVEC
VIEW Micro-Metrology
Optical Metrology Systems
Certified Comparator Products
Profile Projector
Aviation NDT
Probes
Reference Standard
Transducer
Laser Marking System
Fiber Laser Marking Machine
CO2 Laser Marking Machine
UV Laser Marking Machine
Measurement
Coating Thickness - Magnetic Induction / Eddy Current
Porosity / Holidays Detector - High Voltage
Moisture Meter
Ultrasonic Thickness Gauge
Anires Tech Sdn Bhd
2A-2, Jalan Equine 10D,
Taman Equine,
43300 Seri Kembangan,
Selangor, Malaysia.
+603-8958 1918
+603-8958 1916
+6012-498 3908
+6016-211 1918
inquiry@anirestech.com
+60124983908
Message Us
Optical Metrology Systems
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VIEW Micro-Metrology
Optical Metrology Systems
VIEW BENCHMARK 250 High Speed Optical Metrology System
VIEW BENCHMARK 300 High Speed Optical Metrology System
VIEW BENCHMARK 450 High Speed Optical Metrology System
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VIEW BENCHMARK 1500 High Speed Optical Metrology System
VIEW Summit 600
VIEW Summit 625
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VIEW Summit 800
VIEW MicroLine AF 1000
VIEW MicroLine AF Plus 2000
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VIEW Pinnacle 250 High Accuracy Metrology System
VIEW Pinnacle Plus
VIEW VMS ELEMENTS
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